Filter

Alle 3-Ergebnisse anzeigen

Produktliste

Crown Head Probe, Ø0.70 mm (1M+ Cycles) - PT137H156-3327A

Our highest-endurance crown head probe, built for production lines where frequent probe swaps drive up fixture cost. The long body also reaches through the thickest fixture plate assemblies.

Gesamtlänge Kolbendurchmesser Kontaktwiderstand Temperaturbereich Haltbarkeit Nennstrom Federkraft Arbeitstakt Voller Hub
33.27 ±0.10 mm Ø0.70 mm ≤50 mΩ −40°C to 85°C ≥1,000,000 cycles 5.0 A 156 gf ±20% 4.24 mm 4,50 mm
Spezifikation Einzelheiten
Gesamtlänge33.27 ±0.10 mm
KolbendurchmesserØ0.70 mm
Kontaktwiderstand≤50 mΩ
Temperaturbereich−40°C to 85°C
Haltbarkeit≥1,000,000 cycles
Nennstrom5.0 A
Federkraft156 gf ±20%
Arbeitstakt4.24 mm
Voller Hub4,50 mm

→ Angebot anfordern

Crown Head Probe, Ø1.30 mm - PT100H150-1700A

Large-diameter crown head probe for heavy-flux and lead-free solder environments. The high contact force drives the serrated crown through thick flux residue, where lighter probes struggle.

Gesamtlänge Kolbendurchmesser Kontaktwiderstand Temperaturbereich Haltbarkeit Nennstrom Federkraft Arbeitstakt Voller Hub
17.00 ±0.15 mm Ø1.30 mm ≤20 mΩ −40°C bis 80°C ≥100.000 Zyklen 3,0 A 150 gf ±20% 2.40 mm 3.00 mm
Spezifikation Einzelheiten
Gesamtlänge17.00 ±0.15 mm
KolbendurchmesserØ1.30 mm
Kontaktwiderstand≤20 mΩ
Temperaturbereich−40°C bis 80°C
Haltbarkeit≥100.000 Zyklen
Nennstrom3,0 A
Federkraft150 gf ±20%
Arbeitstakt2.40 mm
Voller Hub3.00 mm

→ Angebot anfordern

Crown Head Probe, Ø0.78 mm - PT100H85-845A

Compact crown head probe for ICT and functional test fixtures that run across wide temperature ranges. The serrated crown tip suits automotive thermal cycling and burn-in environments.

Gesamtlänge Kolbendurchmesser Kontaktwiderstand Temperaturbereich Haltbarkeit Nennstrom Federkraft Arbeitstakt Voller Hub
8.45 ±0.15 mm Ø0.78 mm Avg ≤30 mΩ −40°C to 125°C ≥100.000 Zyklen 1.0 A 85 gf ±15 gf 0.60 mm 0.90 mm
Spezifikation Einzelheiten
Gesamtlänge8.45 ±0.15 mm
KolbendurchmesserØ0.78 mm
KontaktwiderstandAvg ≤30 mΩ
Temperaturbereich−40°C to 125°C
Haltbarkeit≥100.000 Zyklen
Nennstrom1.0 A
Federkraft85 gf ±15 gf
Arbeitstakt0.60 mm
Voller Hub0.90 mm

→ Angebot anfordern

How to Choose the Right Crown Head Probe

how to choose the right crown head probe

  1. Assess your pad surface condition. Crown head probes exist to solve one problem: making reliable contact through contaminated pad surfaces. If your test points carry heavy flux residue from no-clean soldering, lead-free solder paste, or oxidation from humidity exposure, crown tips outperform flat and pointed tips because the serrated edges cut through the contamination layer on every insertion. If your pads are clean, gold-plated surfaces, a standard flat or spear tip may be sufficient.
  2. Match spring force to contamination severity. Heavier flux residue demands a higher spring force to drive the crown points through the contamination layer. The PT137H156-3327A at 156 gf and PT100H150-1700A at 150 gf penetrate thick no-clean flux deposits reliably. The PT100H85-845A at 85 gf suits lighter contamination on partially cleaned or selectively soldered boards. Excessive spring force on thin substrates causes board flex. Balance contact reliability against mechanical stress on the DUT.
  3. Stellen Sie Ihr Kontaktwiderstands-Maximum ein. The PT100H150-1700A achieves the lowest contact resistance in the range at below 20 mΩ, suitable for precision analog measurements and low-impedance power rail testing. The PT100H85-845A averages below 30 mΩ for general ICT. The PT137H156-3327A holds below 50 mΩ across its 1,000,000-cycle service life. That is higher than the other models, but it stays stable over a much longer operational period.
  4. Factor cycle life against your production volume. The PT137H156-3327A at 1,000,000+ cycles targets high-volume production lines testing thousands of boards per day. At 500 boards per day, a 1M-cycle probe lasts over five years before replacement. The PT100H85-845A and PT100H150-1700A at 100,000 cycles suit medium-volume lines or prototype-to-production fixtures where lower per-probe cost matters more than extreme longevity.
  5. Consider the overall length and working stroke. The PT100H85-845A at 8.45 mm fits compact fixture builds. The PT137H156-3327A at 33.27 mm reaches through thick multi-plate fixture assemblies with 4.24 mm of working stroke, the longest in this range. Match the working stroke to your fixture’s mechanical tolerance stack to ensure the crown tip maintains full contact pressure across all probe positions during closure.
  6. Nicht sicher? Sprechen Sie mit unseren Ingenieuren. Send us your board layout, fixture drawing, and a description of your soldering process. Our team of 20+ dedicated engineers responds within 1–3 days with a probe recommendation and a free sample timeline.

Technischen Support anfordern →

Von Testingenieuren aus allen Branchen geschätzt

EMS / Contract Manufacturing

We switched to the PT137H156-3327A across four high-volume SMT lines running 2,400 boards per day. Before the switch, we replaced crown probes every quarter because of flux fouling. The 1,000,000-cycle rating eliminated those quarterly swaps entirely. First-pass yield improved by 1.8% in the first three months because false opens from contaminated probe tips dropped to near zero.

Test Engineering Manager,

EMS Contract Manufacturer

Automotive / ECU and Power Module Testing

Our ECU test fixtures cycle between −40°C and 125°C during thermal validation. Flat-tip probes drifted past 50 mΩ after 20,000 cycles and forced monthly recalibration. The PT100H85-845A holds below 30 mΩ across the full temperature range and has not required recalibration in over six months of continuous production testing.

Test Fixture Design Engineer,

Automotive Tier-1 Supplier

Consumer Electronics / Lead-Free Assembly

Lead-free no-clean flux on our SMT line leaves some of the hardest residue we’ve tested against. The PT100H150-1700A’s 150 gf crown tip cuts through it without manual cleaning between shifts. Contact resistance stays below 20 mΩ across the fixture’s full service life. We reduced our probe cleaning schedule from twice daily to once a week.

Quality/Test Engineer,

Consumer Electronics OEM

Crown Head Probes FAQs

What is a crown head probe?

A crown head probe is a spring-loaded test contact with a serrated, multi-point tip shaped like a crown. The multiple raised points distribute contact force across several small contact areas simultaneously, cutting through flux residue, solder paste, and surface oxidation that would cause a single-point or flat tip to lose electrical continuity. Most ICT fixtures testing boards with no-clean flux or lead-free solder rely on crown tips for this reason.

Why use crown tips instead of flat or pointed tips?

Crown tips self-clean on every insertion. Each serrated point scrapes through surface contamination independently, so even if one or two points foul, the remaining points maintain electrical contact. Flat tips ride on top of flux films and lose conductivity. Pointed tips can puncture through contamination but risk damaging the pad and accumulating debris in a single contact point. Crown tips balance penetration, pad protection, and self-cleaning across the full service life.

How many mating cycles can crown head probes achieve?

Our crown head probes range from 100,000 to 1,000,000+ cycles. The PT137H156-3327A achieves the highest rating at 1,000,000+ cycles, targeting production lines testing thousands of boards per day. The PT100H85-845A and PT100H150-1700A are rated at 100,000 cycles for medium-volume production and prototype-to-production fixtures.

What current can crown head probes carry?

Current ratings span 1.0 A for the compact PT100H85-845A up to 5.0 A for the PT137H156-3327A. The PT100H150-1700A handles 3.0 A for mid-range power rail testing. For test points requiring higher currents, contact our engineering team to discuss custom configurations.

Are crown head probes suitable for lead-free solder applications?

Yes, lead-free soldering processes using SAC alloys and no-clean flux produce harder, more tenacious residue than traditional tin-lead processes. Crown head probes are built for this environment. The serrated tips cut through harder flux deposits where flat tips fail. Higher spring forces in the 85–156 gf range help the crown points penetrate the more resistant contamination layer.

Can I get crown head probes with custom specifications?

Yes, our engineers customize crown blade count, tip diameter, spring force, overall length, and plating material to match your fixture and pad geometry. Send your DUT contact drawing and soldering process details, and our team provides a design recommendation within 1–3 business days.

Welche Zertifizierungen hat Promax in der Herstellung von Prüfspitzen?

Wir sind nach ISO 9001, ISO 14001, ISO 45001 und IECQ QC080000 zertifiziert. Unsere Produktionsstätte erzielt eine Serienausbeute von über 99,1 % bei mehr als 8.000 kundenspezifischen Designs, die an Kunden wie Huawei, Xiaomi und Amphenol geliefert werden.

Bieten Sie kostenlose Muster für Qualifizierungstests an?

Yes, we provide free samples so you can validate fit, contact resistance, and self-cleaning performance in your fixture before committing to production. Standard catalog configurations ship within two weeks. Custom samples may take additional time depending on design complexity.

Angebot einholen