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Double-End Probe, Ø0.65 mm - PB101B1580B-43A

Large-diameter double-end probe for power rail testing and high-current test points in wireless fixtures. The gentle spring force keeps board flex low on thin and rigid-flex PCBs.

Longitud total Diámetro del émbolo Resistencia de contacto Rango de temperatura Durabilidad Corriente Nominal Fuerza de resorte Carrera de trabajo Carrera completa
15.80 ±0.15 mm Ø0.65 ±0.01 mm ≤100 mΩ −40°C to 85°C ≥100.000 ciclos 4.0 A 43 gf ±20% 2.40 mm 3.60 mm
Especificación Detalles
Longitud total 15.80 ±0.15 mm
Diámetro del émbolo Ø0.65 ±0.01 mm
Resistencia de contacto ≤100 mΩ
Rango de temperatura −40°C to 85°C
Durabilidad ≥100.000 ciclos
Corriente Nominal 4.0 A
Fuerza de resorte 43 gf ±20%
Carrera de trabajo 2.40 mm
Carrera completa 3.60 mm

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Double-End Probe, Ø0.40 mm - PB062B1950B-80A

Standard-diameter workhorse for general-purpose wireless ICT and functional test fixtures. It holds firm contact even on pads with moderate oxidation.

Longitud total Diámetro del émbolo Resistencia de contacto Rango de temperatura Durabilidad Corriente Nominal Fuerza de resorte Carrera de trabajo Carrera completa
19.50 mm Ø0.40 ±0.01 mm ≤70 mΩ −40°C to 125°C ≥100.000 ciclos 3,0 A 80 gf ±20% 2.50 mm 3.20 mm
Especificación Detalles
Longitud total 19.50 mm
Diámetro del émbolo Ø0.40 ±0.01 mm
Resistencia de contacto ≤70 mΩ
Rango de temperatura −40°C to 125°C
Durabilidad ≥100.000 ciclos
Corriente Nominal 3,0 A
Fuerza de resorte 80 gf ±20%
Carrera de trabajo 2.50 mm
Carrera completa 3.20 mm

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Double-End Probe, Ø0.20 mm (3.00 mm) - PX035T300T-38A

Our shortest double-end probe, made for thin fixture assemblies and board-to-board interconnect testing. Use it where Z-axis clearance is severely limited.

Longitud total Diámetro del émbolo Resistencia de contacto Rango de temperatura Durabilidad Corriente Nominal Fuerza de resorte Carrera de trabajo Carrera completa
5.70 ±0.15 mm Ø0.13 ±0.01 mm ≤150 mΩ −40°C to 85°C ≥100.000 ciclos 2.0 A 30 gf ±20% 0.65 mm 0.80 mm
Especificación Detalles
Longitud total 5.70 ±0.15 mm
Diámetro del émbolo Ø0.13 ±0.01 mm
Resistencia de contacto ≤150 mΩ
Rango de temperatura −40°C to 85°C
Durabilidad ≥100.000 ciclos
Corriente Nominal 2.0 A
Fuerza de resorte 30 gf ±20%
Carrera de trabajo 0.65 mm
Carrera completa 0.80 mm

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Double-End Probe, Ø0.20 mm (9.00 mm) - PB038B900B-40C

Higher-force variant at the same diameter, built for test points with heavier oxidation or solder residue. The firmer contact pushes through surface contamination that lighter probes skip over.

Longitud total Diámetro del émbolo Resistencia de contacto Rango de temperatura Durabilidad Corriente Nominal Fuerza de resorte Carrera de trabajo Carrera completa
9.00 ±0.15 mm Ø0.20 ±0.01 mm ≤200 mΩ −40°C to 85°C ≥80,000 cycles 1.0 A 40 gf ±20% 1.40 mm 1.60 mm
Especificación Detalles
Longitud total 9.00 ±0.15 mm
Diámetro del émbolo Ø0.20 ±0.01 mm
Resistencia de contacto ≤200 mΩ
Rango de temperatura −40°C to 85°C
Durabilidad ≥80,000 cycles
Corriente Nominal 1.0 A
Fuerza de resorte 40 gf ±20%
Carrera de trabajo 1.40 mm
Carrera completa 1.60 mm

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Double-End Probe, Ø0.20 mm (8.85 mm) - PB038B885D-30A

Extended-length double-end probe for thicker fixture plates and multi-layer board stacks. It reaches deeper test points than the compact PX035T300T-38A while keeping the same plunger diameter.

Longitud total Diámetro del émbolo Resistencia de contacto Rango de temperatura Durabilidad Corriente Nominal Fuerza de resorte Carrera de trabajo Carrera completa
8.85 ±0.15 mm Ø0.20 ±0.01 mm ≤150 mΩ −40°C to 85°C ≥50,000 cycles 1.0 A 30 gf ±20% 1.50 mm 2.00 mm
Especificación Detalles
Longitud total 8.85 ±0.15 mm
Diámetro del émbolo Ø0.20 ±0.01 mm
Resistencia de contacto ≤150 mΩ
Rango de temperatura −40°C to 85°C
Durabilidad ≥50,000 cycles
Corriente Nominal 1.0 A
Fuerza de resorte 30 gf ±20%
Carrera de trabajo 1.50 mm
Carrera completa 2.00 mm

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Double-End Probe, Ø0.13 mm - PB028B570B-30C

Fine-pitch double-end probe that bridges ultra-fine and standard test work. A good fit for production-volume IC and BGA test fixtures where you need more current capacity than the Ø0.08 mm allows without jumping to a full-size probe.

Longitud total Diámetro del émbolo Resistencia de contacto Rango de temperatura Durabilidad Corriente Nominal Fuerza de resorte Carrera de trabajo Carrera completa
5.70 ±0.15 mm Ø0.13 ±0.01 mm ≤150 mΩ −40°C to 85°C ≥100.000 ciclos 2.0 A 30 gf ±20% 0.65 mm 0.80 mm
Especificación Detalles
Longitud total 5.70 ±0.15 mm
Diámetro del émbolo Ø0.13 ±0.01 mm
Resistencia de contacto ≤150 mΩ
Rango de temperatura −40°C to 85°C
Durabilidad ≥100.000 ciclos
Corriente Nominal 2.0 A
Fuerza de resorte 30 gf ±20%
Carrera de trabajo 0.65 mm
Carrera completa 0.80 mm

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Double-End Probe, Ø0.08 mm - PB020F240B-11A

Our finest double-end probe, built for pitches below 0.30 mm. Use it on wafer-level probe cards and advanced packaging test sockets where bond pads and solder bumps are delicate.

Longitud total Diámetro del émbolo Resistencia de contacto Rango de temperatura Durabilidad Corriente Nominal Fuerza de resorte Carrera de trabajo Carrera completa
2.40 ±0.15 mm Ø0.08 ±0.01 mm ≤200 mΩ −40°C to 125°C ≥50,000 cycles 0.2 A 11 gf ±20% 0.20 mm 0.40 mm
Especificación Detalles
Longitud total 2.40 ±0.15 mm
Diámetro del émbolo Ø0.08 ±0.01 mm
Resistencia de contacto ≤200 mΩ
Rango de temperatura −40°C to 125°C
Durabilidad ≥50,000 cycles
Corriente Nominal 0.2 A
Fuerza de resorte 11 gf ±20%
Carrera de trabajo 0.20 mm
Carrera completa 0.40 mm

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How to Choose the Right Double-End Probe

how to choose the right double end probe

  1. Empareja el diámetro del émbolo con el paso de tu punto de prueba. Start with the pad size and center-to-center spacing on your DUT. Ultra-fine pitch below 0.30 mm requires the Ø0.08 mm PB020F240B-11A. Fine-pitch layouts from 0.30 to 0.50 mm use the Ø0.13 to Ø0.20 mm probes. Standard 1.27 to 2.54 mm pitch wireless fixtures use the Ø0.40 to Ø0.65 mm probes for better current capacity and lower contact resistance.
  2. Determine whether you need wireless or receptacle-based testing. Double-end probes eliminate the need for wired receptacles by providing spring-loaded compliance on both ends. That simplifies fixture assembly and reduces wiring errors. If your fixture design requires a traditional top-probe-plus-receptacle approach, single-end probes are the better fit.
  3. Set your current capacity requirement. Current ratings span 0.2 A for the ultra-fine PB020F240B-11A up to 4.0 A for the Ø0.65 mm PB101B1580B-43A. Match the probe’s rated current to the maximum current your test point will carry. For power rail testing, the PB062B1950B-80A at 3.0 A and PB101B1580B-43A at 4.0 A handle the highest loads in this range.
  4. Verifique su rango de temperatura de funcionamiento. Three models operate from −40°C to 125°C: the PB020F240B-11A, PX035T300T-38A, and PB062B1950B-80A. That range covers automotive thermal cycling and burn-in test environments. The remaining models cover −40°C to 85°C. Specify probes rated for the full range of your test chamber temperatures.
  5. Consider overall length and stroke for your fixture stack. The PX035T300T-38A at 3.00 mm fits ultra-thin fixture builds. The PB062B1950B-80A at 19.50 mm reaches across thicker board stacks and fixture plates. The working stroke determines how much mechanical tolerance the probe absorbs during fixture closure. The PB062B1950B-80A provides the longest working stroke at 2.50 mm.
  6. ¿No estás seguro? Habla con nuestros ingenieros. Send us your board layout and fixture drawing. Our team of 20+ dedicated engineers respond within 1 to 3 days with a probe recommendation and free sample timeline.

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Confianza de ingenieros de pruebas en todas las industrias

Consumer Electronics / Wireless ICT Fixtures

We switched from wired single-end fixtures to Promax PB062B1950B-80A double-end probes across two SMT production lines. Fixture wiring time dropped by roughly 40%, and false-failure rates fell from 1.8% to under 0.5% within the first 60,000 cycles. The wireless design cut our fixture rebuild turnaround from five days to two.

Test Fixture Design Lead,

Contract Electronics Manufacturer, Shenzhen

Semiconductor / Advanced Packaging Test

Our probe card team tested the Ø0.08 mm PB020F240B-11A on fan-out wafer-level packaging with 0.25 mm pitch bond pads. Contact resistance stayed within spec through 50,000 insertions with zero pad damage on 45 nm redistribution layers. The ±0.01 mm diameter tolerance gave us the positional accuracy we needed for interposer-level test sockets.

Probe Card Engineer,

Semiconductor Test Equipment Integrator, Hsinchu

Automotive / EV Power Module Testing

We needed probes that could handle thermal expansion across −40°C to 125°C burn-in cycles on EV battery management boards. The PB062B1950B-80A at 3.0 A gave us consistent contact through 80,000+ thermal cycles without fixture re-alignment. The floating dual-plunger design absorbed board warpage that was causing intermittent opens on our old wired fixtures.

Test Fixture Design Engineer,

Automotive Tier-1 Supplier, Stuttgart

Double-End Test Probes FAQs

What is the difference between double-end and single-end probes?

A double-end probe has spring-loaded plungers on both ends, providing compliance on the top and bottom contact surfaces simultaneously. A single-end probe has one spring-loaded plunger, and a fixed receptacle or solder tail at the opposite end. Double-end probes enable wireless, receptacle-free fixture designs, while single-end probes anchor into fixture plates for traditional bed-of-nails wiring.

What is the smallest plunger diameter available for double-end probes?

We manufacture double-end probes with plunger diameters as small as Ø0.08 mm at a ±0.01 mm tolerance. The PB020F240B-11A at this diameter fits test point pitches down to 0.30 mm for ultra-fine-pitch wafer-level and advanced packaging test applications.

How do double-end probes work in a wireless test fixture?

In a wireless fixture, double-end probes sit in a drilled guide plate without wired connections. The top plunger contacts the DUT test point, and the bottom plunger contacts the corresponding trace or pad on a transfer board or interface PCB below. The dual-spring design absorbs mechanical tolerance on both sides, simplifying fixture assembly and eliminating receptacle wiring.

What current can double-end probes carry?

Current ratings in the double-end range span from 0.2 A for the ultra-fine Ø0.08 mm probe to 4.0 A for the Ø0.65 mm PB101B1580B-43A. For power rail test points requiring higher currents, contact our engineering team to discuss multi-contact or custom high-current configurations.

How long do double-end probes last in a production fixture?

Cycle life ranges from 50,000 to 100,000+ insertions depending on plunger diameter, plating thickness, and spring force. Most models in the double-end range are rated at 100,000 cycles or above. Match the rated durability to your fixture’s expected lifetime test count before scheduling probe replacement.

Can I get double-end probes with custom specifications?

Yes, our engineers design custom double-end probes for non-standard pitches, specific overall lengths, custom spring forces, and application-specific plating materials. Send your DUT contact drawing and fixture specification, and our team provides a design recommendation within 1 to 3 business days.

¿Qué certificaciones tiene Promax para la fabricación de sondas de prueba?

Contamos con las certificaciones ISO 9001, ISO 14001, ISO 45001 e IECQ QC080000. Nuestra planta de producción mantiene un rendimiento de producción en serie superior al 99,1 % en más de 8.000 diseños personalizados entregados a clientes como Huawei, Xiaomi y Amphenol.

¿Ofrecen muestras gratuitas para pruebas de calificación?

Sí, ofrecemos muestras gratuitas para que puedas validar el ajuste, la resistencia de contacto y la compatibilidad mecánica en tu dispositivo antes de comprometerte con la producción. Las configuraciones estándar del catálogo se envían en dos semanas. Las muestras personalizadas pueden tardar un tiempo adicional dependiendo de la complejidad del diseño.

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