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IC Test Probes: Product Range

IC Test Probe, 0.22 mm Plunger - PB038B570B-25A

Higher-current IC test probe rated at 2.0A with a 0.22 mm plunger diameter. Delivers stable contact resistance below 100 mΩ through 100,000+ cycles. The wider plunger handles power delivery lines on IC packages that carry heavier loads during test.

pb038b570b 25a
Longitud Diámetro del émbolo Current Resistencia de contacto Fuerza de resorte Stroke Rango de temperatura Durabilidad
5.70 ±0.15 mm 0.22 ±0.01 mm 2.0A ≤100 mΩ 24.5 gf ±20% 0.80 mm completo, 0.65 mm operativo −40°F–185°F ≥100.000 ciclos
Especificación Detalles
Longitud5.70 ±0.15 mm
Diámetro del émbolo0.22 ±0.01 mm
Current2.0A
Resistencia de contacto≤100 mΩ
Fuerza de resorte24.5 gf ±20%
Stroke0.80 mm completo, 0.65 mm operativo
Rango de temperatura−40°F–185°F
Durabilidad≥100.000 ciclos

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Mid-range IC Test Probe - PB035D570B-28A

Sonda de prueba de IC de gama media con un émbolo de 0.20 mm y una corriente nominal de 1.5 A. La menor fuerza de resorte de 28 gf la hace adecuada para aplicaciones donde el marcado mínimo de la almohadilla es importante. La resistencia de contacto está clasificada en 120 mΩ o menos.

pb035d570b 28a
Longitud Diámetro del émbolo Current Resistencia de contacto Fuerza de resorte Stroke Rango de temperatura Durabilidad
5.70 mm 0.20 ±0.01 mm 1,5A ≤120 mΩ 28 gf ±20% 0.90 mm completo, 0.65 mm de trabajo Sin especificar ≥30.000 ciclos
Especificación Detalles
Longitud5.70 mm
Diámetro del émbolo0.20 ±0.01 mm
Current1,5A
Resistencia de contacto≤120 mΩ
Fuerza de resorte28 gf ±20%
Stroke0.90 mm completo, 0.65 mm de trabajo
Rango de temperaturaSin especificar
Durabilidad≥30.000 ciclos

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IC Test Probe, 0.15 mm Plunger - PB031B570B-35B

Ultra-fine plunger IC test probe for high-density semiconductor packages. At 0.15 mm plunger diameter, it’s built for fine-pitch BGA and QFP test sockets where space between pads is tight. Contact resistance stays below 100 mΩ across 100,000+ test cycles.

pb031b570b 35b
Longitud total Plunger Diameter Ø Corriente Nominal Resistencia de contacto Fuerza de resorte Carrera de trabajo Rango de temperatura Durabilidad
5.70 ±0.15 mm 0.15 ±0.01 mm 1.0A ≤100 mΩ 35 gf ±20% 1.00 mm completo, 0.65 mm útil -40 °F - 302 °F ≥100.000 ciclos
Especificación Detalles
Longitud total5.70 ±0.15 mm
Plunger Diameter Ø0.15 ±0.01 mm
Corriente Nominal1.0A
Resistencia de contacto≤100 mΩ
Fuerza de resorte35 gf ±20%
Carrera de trabajo1.00 mm completo, 0.65 mm útil
Rango de temperatura-40 °F - 302 °F
Durabilidad≥100.000 ciclos

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How to Choose the Right IC Test Probe

how to choose the right ic test probe

  1. Define your pitch and package type. Start with the center-to-center pad spacing on your DUT. Pitches below 0.4 mm need barrel diameters of 0.31 mm or smaller. Identify whether you’re testing QFP, BGA, CSP, or custom IC packages. Each may require a different tip geometry.
  2. Determine your current and signal requirements. Standard IC test probes handle 1A. Power IC validation and burn-in applications may need 3A or higher. High-frequency signal paths also require probes with controlled impedance and minimal inductance.
  3. Choose single-active or double-active. Single-active probes work for most final test sockets with a fixed load board interface. Double-active probes add compliance on both ends, which helps with coplanarity variations in fine-pitch sockets.
  4. Verifique su rango de temperatura de funcionamiento. Standard IC test probes operate from −40°F to 302°F. Burn-in applications at elevated temperatures should confirm the probe’s rated range before ordering. Let us know your thermal profile when requesting a quote.
  5. Check compliance and certifications. Promax Pogo Pin holds ISO 9001, ISO 14001, ISO 45001, and IECQ QC080000 certifications. All probes are RoHS-compliant. If your application requires additional traceability or material certifications, let us know during the quoting process.
  6. Not sure which probe fits? Talk to our engineers. Send us your test socket drawing or DUT pad layout. We’ll recommend the right probe and ship free samples within two weeks.

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What Engineers Say About Our IC Test Probes

Semiconductor Final Test

We switched to Promax IC test probes after our previous supplier’s probes started drifting in contact resistance around 60,000 cycles. Promax’s crown-tip probes held below 40 mΩ past 120,000 cycles in our handler. That cut our probe replacement frequency by 40% and reduced false rejects on our QFP final test line.

Senior Test Engineer,

Tier-1 Semiconductor OEM, Shenzhen

Medical Device PCB Testing

“We needed double-active probes for a 0.35 mm pitch medical device IC with strict coplanarity requirements. Promax delivered samples in 12 days and matched our existing socket dimensions exactly. Their engineering team flagged a spring force issue we’d have missed, saving us a round of test fixture rework.

Hardware Validation Lead,

Medical Electronics OEM, Munich

Automotive IC Burn-In

Our burn-in sockets run at 302°F and cycle 500+ times per day. We’d been replacing probes every three weeks. Promax’s gold-plated cup-tip probes lasted over eight weeks under the same conditions. The direct factory pricing also came in 25% below our previous supplier.

Reliability Engineer,

Tier-2 Automotive Supplier, Detroit

IC Test Probes FAQs

What tip style should I use for my IC test application?

Four-point or five-point crown tips are the most common choice. They scrub through oxide on aluminum bond pads and provide stable, low-resistance contact. For fine-pitch packages below 0.4 mm, conical tips offer precise single-point contact with less pad damage. Our engineers can recommend the right tip based on your pad metallurgy, package type, and cycle life target.

What’s the minimum order quantity for custom IC test probes?

Standard catalog probes have no fixed minimum. Custom designs typically start at 500–1,000 units to cover tooling costs. We provide free samples of standard models so you can validate fit and performance in your test socket before committing to a production order.

How long does it take to get custom IC test probes?

Engineering review and design feedback takes 1–3 days. Samples ship within two weeks of design approval. Production orders ship in 2–4 weeks, depending on quantity and customization level. If you’re on a tight test program schedule, let us know early and we’ll align our timeline.

Can Promax match an IC test probe I’m currently using from another supplier?

Yes, send us the datasheet, part number, or a physical sample. We’ll reverse-engineer the probe to match your existing socket dimensions, spring force, and tip geometry. Many clients switch to Promax to reduce cost or lead time without redesigning their test fixtures.

What materials and plating do you use for IC test probes?

Probe barrels use Beryllium Copper or nickel silver for spring consistency and durability. Plunger tips are plated with Gold or Palladium to maintain low contact resistance and resist oxide buildup. Springs use music wire calibrated within ±5% of the target force. Material and plating selections depend on your pad metallurgy and cycle life requirements.

What certifications does Promax Pogo Pin hold?

Promax is certified to ISO 9001, ISO 14001, ISO 45001, and IECQ QC080000. All probes are RoHS-compliant. We also hold 22+ patents in pogo pin and spring-loaded contact technology.

Do you offer IC test probes for high-temperature burn-in applications?

Yes, our probes operate reliably at temperatures up to 302°F. For burn-in sockets that cycle at elevated temperatures, we use gold plating and high-temperature spring alloys that maintain consistent contact force across the full thermal range. Let us know your operating temperature and cycle frequency when requesting a quote.

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