Our finest double-end probe, built for pitches below 0.30 mm. Use it on wafer-level probe cards and advanced packaging test sockets where bond pads and solder bumps are delicate.
| Overall Length | Plunger Diameter | Contact Resistance | Temperature Range | Durability | Rated Current | Spring Force | Working Stroke | Full Stroke |
|---|---|---|---|---|---|---|---|---|
| 2.40 ±0.15 mm | Ø0.08 ±0.01 mm | ≤200 mΩ | −40°C to 125°C | ≥50,000 cycles | 0.2 A | 11 gf ±20% | 0.20 mm | 0.40 mm |
| Specification | Details |
|---|---|
| Overall Length | 2.40 ±0.15 mm |
| Plunger Diameter | Ø0.08 ±0.01 mm |
| Contact Resistance | ≤200 mΩ |
| Temperature Range | −40°C to 125°C |
| Durability | ≥50,000 cycles |
| Rated Current | 0.2 A |
| Spring Force | 11 gf ±20% |
| Working Stroke | 0.20 mm |
| Full Stroke | 0.40 mm |


