This probe delivers the longest cycle life in the fine pitch range at 200,000+ insertions, paired with contact resistance at or below 100 mΩ. A strong fit for high-volume semiconductor final test and burn-in sockets where frequent probe swaps drive up fixture cost.
| Overall Length | Plunger Diameter | Contact Resistance | Temperature Range | Durability | Rated Current | Spring Force | Working Stroke | Full Stroke |
|---|---|---|---|---|---|---|---|---|
| 6.10 ±0.15 mm | Ø0.10 mm | ≤100 mΩ | Not specified | ≥200,000 cycles | 1.0 A | 30 gf ±20% | 0.70 mm | 1.00 mm |
| Specification | Details |
|---|---|
| Overall Length | 6.10 ±0.15 mm |
| Plunger Diameter | Ø0.10 mm |
| Contact Resistance | ≤100 mΩ |
| Temperature Range | Not specified |
| Durability | ≥200,000 cycles |
| Rated Current | 1.0 A |
| Spring Force | 30 gf ±20% |
| Working Stroke | 0.70 mm |
| Full Stroke | 1.00 mm |


