PB038B570B-25A IC Test Probe, 0.22 mm Plunger

Specification	Details
Overall Length	5.70 ±0.15 mm
Plunger Diameter	0.22 ±0.01 mm
Rated Current	2.0A
Contact Resistance	≤100 mΩ
Spring Force	24.5 gf ±20%
Working Stroke	0.80 mm full, 0.65 mm working
Temperature Range	−40°F–185°F
Durability	≥100,000 cycles

Specification

Details

Overall Length

5.70 ±0.15 mm

Plunger Diameter

0.22 ±0.01 mm

Rated Current

2.0A

Contact Resistance

≤100 mΩ

Spring Force

24.5 gf ±20%

Working Stroke

0.80 mm full, 0.65 mm working

Temperature Range

−40°F–185°F

Durability

≥100,000 cycles

Higher-current IC test probe rated at 2.0A with a 0.22 mm plunger diameter. Delivers stable contact resistance below 100 mΩ through 100,000+ cycles. The wider plunger handles power delivery lines on IC packages that carry heavier loads during test.

Length	Plunger Diameter	Current	Contact Resistance	Spring Force	Stroke	Temperature Range	Durability
5.70 ±0.15 mm	0.22 ±0.01 mm	2.0A	≤100 mΩ	24.5 gf ±20%	0.80 mm full, 0.65 mm working	−40°F–185°F	≥100,000 cycles

Specification	Details
Length	5.70 ±0.15 mm
Plunger Diameter	0.22 ±0.01 mm
Current	2.0A
Contact Resistance	≤100 mΩ
Spring Force	24.5 gf ±20%
Stroke	0.80 mm full, 0.65 mm working
Temperature Range	−40°F–185°F
Durability	≥100,000 cycles

Overall length	5.70 ±0.15 mm
Plunger diameter	0.22 ±0.01 mm
Rated Current	2.0A
Contact resistance	≤100 mΩ
Spring Force	24.5 gf ±20%
Working stroke	0.80 mm full, 0.65 mm working
Temperature Range	−40°F–185°F
Durability	≥100,000 cycles

PB038B570B-25A IC Test Probe, 0.22 mm Plunger

Related products

Login