ISO 9001, ISO 14001, ISO 45001, and IECQ QC080000
Over 15 Years of Expertise
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Compact ICT probe for tight-pitch test point layouts. Low 58 gf spring force reduces board stress during testing. Contact resistance below 35 mΩ for accurate signal-level measurements.
| Overall Length | Plunger Ø | Rated Current | Contact Resistance | Full Stroke | Working Stroke | Spring Force | Temperature Range | Durability |
|---|---|---|---|---|---|---|---|---|
| 17.15 ±0.08 mm | Ø0.66 ±0.05 mm | 1.0 A | <35 mΩ | 3.25 mm | 1.83 mm | 58 gf ±20% | −40°F–302°F | ≥20,000 cycles |
| Specification | Details |
|---|---|
| Overall Length | 17.15 ±0.08 mm |
| Plunger Ø | Ø0.66 ±0.05 mm |
| Rated Current | 1.0 A |
| Contact Resistance | <35 mΩ |
| Full Stroke | 3.25 mm |
| Working Stroke | 1.83 mm |
| Spring Force | 58 gf ±20% |
| Temperature Range | −40°F–302°F |
| Durability | ≥20,000 cycles |
