single end test probe

PB031B570B-35A — Single-End Probe, Ø0.15 mm

Specification	Details
Overall Length	26.00 ±0.15 mm
Plunger Diameter	Ø0.20 ±0.01 mm
Contact Resistance	≤150 mΩ
Temperature Range	−40°C to 80°C
Durability	≥100,000 cycles
Rated Current	2.0 A
Spring Force	60 gf ±20%
Working Stroke	3.50 mm
Full Stroke	4.50 mm

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Category: Single-End Probes

Description
Additional information

Micro-diameter probe for fine-pitch IC test sockets, BGA interposers, and wafer-level probe cards. Use it where test point spacing drops below 0.50 mm.

Overall Length	Plunger Diameter	Contact Resistance	Temp. Range	Durability	Rated Curren	Spring Force	Working Stroke	Full Stroke
26.00 ±0.15 mm	Ø0.20 ±0.01 mm	≤150 mΩ	−40°C to 80°C	≥100,000 cycles	2.0 A	60 gf ±20%	3.50 mm	4.50 mm

Specification	Details
Overall Length	26.00 ±0.15 mm
Plunger Diameter	Ø0.20 ±0.01 mm
Contact Resistance	≤150 mΩ
Temp. Range	−40°C to 80°C
Durability	≥100,000 cycles
Rated Current	2.0 A
Spring Force	60 gf ±20%
Working Stroke	3.50 mm
Full Stroke	4.50 mm

Overall length	26.00 ±0.15 mm
Plunger diameter	Ø0.20 ±0.01 mm
Contact resistance	≤150 mΩ
Durability	≥100,000 cycles
Rated Current	2.0 A
Spring Force	60 gf ±20%
Working stroke	3.50 mm
Full stroke	4.50 mm
Temperature Range	−40°C to 80°C

Get a Quote