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Liste de produits

High-force ICT probe - PT137A200-3340A

High-force ICT probe for aggressive contact on oxidized or contaminated pads. Supports 10 A instantaneous current for power rail testing. 200 gf spring force breaks through flux residue reliably.

PT137A200-3340A Sonde ICT haute force
Longueur totale Plunger Ø Courant nominal Résistance de contact Course complète Temps de travail Force du ressort Plage de température Durabilité
33,40 ±0,10 mm Ø 0,90 mm 3,0 A continu, 10 A instantané < 20 mΩ 6,40 mm 4,30 mm 200 gf ±20% −40°C–100°C ≥3 000 cycles
Spécification Détails
Longueur totale33,40 ±0,10 mm
Plunger ØØ 0,90 mm
Courant nominal3,0 A continu, 10 A instantané
Résistance de contact< 20 mΩ
Course complète6,40 mm
Temps de travail4,30 mm
Force du ressort200 gf ±20%
Plage de température−40°C–100°C
Durabilité≥3 000 cycles

Compact ICT probe - PT100T58-1715C

Sonde TIC compacte pour des tracés de points de test à pas serré. Faible force de ressort de 58 gf pour réduire le stress sur la carte pendant les tests. Résistance de contact inférieure à 35 mΩ pour des mesures précises au niveau du signal.

Sonde compacte TIC PT100T58-1715C
Longueur totale Plunger Ø Courant nominal Résistance de contact Course complète Temps de travail Force du ressort Plage de température Durabilité
17,15 ±0,08 mm Ø0,66 ±0,05 mm 1.0 A <35 mΩ 3,25 mm 1,83 mm 58 gf ±20% −40°C–150°C ≥20 000 cycles
Spécification Détails
Longueur totale17,15 ±0,08 mm
Plunger ØØ0,66 ±0,05 mm
Courant nominal1.0 A
Résistance de contact<35 mΩ
Course complète3,25 mm
Temps de travail1,83 mm
Force du ressort58 gf ±20%
Plage de température−40°C–150°C
Durabilité≥20 000 cycles

Standard ICT Probe - PT078B160-3460A

Standard ICT probe for high-volume PCB testing. Built for lead-free solder pad contact in production-line bed-of-nails fixtures.

pt078b160 3460a sonde ict standard
Longueur totale Plunger Ø Courant nominal Résistance de contact Course complète Temps de travail Force du ressort Plage de température Durabilité
34,60 ± 0,20 mm Ø0.50 ±0.02 mm 3,0 A 185 mΩ 6,35 mm 6,00 mm 160 gf ±20% −40°C–150°C ≥200 000 cycles
Spécification Détails
Longueur totale34,60 ± 0,20 mm
Plunger ØØ0.50 ±0.02 mm
Courant nominal3,0 A
Résistance de contact185 mΩ
Course complète6,35 mm
Temps de travail6,00 mm
Force du ressort160 gf ±20%
Plage de température−40°C–150°C
Durabilité≥200 000 cycles

How to Choose the Right ICT Test Probe

how to choose the right ict test probe

  1. Define your current rating requirement: Determine how much current your test points need to carry. Standard ICT probes handle 1–3 A for signal-level measurements. Power rail test points may need probes rated for 10 A instantaneous, like our PT137A200-3340A.
  2. Match spring force to your pad condition: Higher spring force breaks through flux residue and oxidation but increases board stress. For lead-free assemblies with heavy flux residue, 160–200 gf provides more reliable contact.
  3. Check plunger diameter against your test point size: The plunger must land cleanly on your test pad without bridging to adjacent traces. Smaller plunger diameters are better for tight-pitch layouts.
  4. Evaluate contact resistance for your measurement accuracy: Lower contact resistance means more accurate readings, especially for low-value component measurements. For high-accuracy testing, specify probes below 35 mΩ.
  5. Factor in lifecycle against your production volume: Match the lifecycle rating to your expected test volume per probe change cycle to optimize cost per test.
  6. Not sure? Talk to our engineers: Send us your board layout and fixture drawing. Our team of 20+ dedicated engineers respond within 1–3 days with a probe recommendation and free sample timeline. Demander de l'aide à l'ingénierie

Demander de l'aide à l'ingénierie

Adopté par les ingénieurs de test dans tous les secteurs

Consumer Electronics

We switched to Promax ICT probes after experiencing inconsistent contact resistance readings on our TWS earbuds production line. The PT078B160-3460A held stable below 185 mΩ across 150,000+ test cycles without replacement. That consistency cut our false failure rate by roughly 40%, which meant fewer boards going to manual re-test and faster line throughput overall.

Wei Lin, Senior Test Engineer,

Tier-1 Consumer Electronics OEM, Shenzhen

Automobile / Véhicules électriques

Our BMS test fixtures need probes that can handle 10 A instantaneous current without degrading. The PT137A200-3340A gave us the spring force and current capacity we needed for power rail testing on EV battery management boards. The 200 gf force breaks through lead-free flux residue cleanly. It’s something our previous probes struggled with. We’ve reduced probe-related test escapes to near zero on that fixture.

Markus Roth, Test Fixture Design Lead,

Automotive Electronics Tier-2 Supplier, Germany

Medical Devices

For our Class II medical device PCB testing, we needed ICT probes with low contact resistance and documented traceability. Promax delivered the PT100T58-1715C with full material and plating certifications, and the 58 gf spring force was gentle enough to avoid damaging our fine-pitch components. Turnaround on custom samples was under two weeks, which kept our validation timeline on track.

Dr. Aisha Patel, Quality Assurance Manager,

Medical Device Manufacturer, California, USA

ICT Test Probes FAQs

What plating options are available for ICT test probes?

Promax ICT probes are available with Gold, Nickel, Palladium-Nickel, and Platinum plating. Gold is the standard for most ICT applications, as it delivers the lowest and most stable contact resistance. Thicker Gold plating extends probe lifecycle in high-volume production environments. Our engineering team recommends the right option based on your test volume and pad surface condition.

What tip types do you offer for ICT test probes?

We offer crown, spear, serrated, flat, cup, and round tip geometries. Crown tips are the default for general ICT work. They provide reliable multi-point contact on standard solder pads. For fine-pitch applications below 0.5 mm, spear tips deliver more precise targeting. Your Promax Pogo Pin engineer can match tip geometry to your specific board layout.

Can you supply probes compatible with existing fixture receptacles?

Yes. We manufacture probes to match standard receptacle sizes used in major ICT platforms, including 100 mil, 75 mil, and 50 mil center configurations. Send us your receptacle spec or fixture drawing and we’ll confirm compatibility before sampling.

What is the minimum order quantity for custom ICT probes?

Standard catalog probes have no fixed minimum, so you can order as few as you need. Custom designs typically require 500–1,000 units to cover tooling costs. We provide free samples for qualification testing before you commit to a production order.

How long do ICT test probes last?

Lifecycle depends on spring force, plating type, tip geometry, and board cleanliness. Our standard ICT probes are rated from ≥3,000 to ≥200,000 cycles under typical test conditions. Higher-grade Gold plating and optimized spring materials extend the lifecycle significantly. Contact our team with your test volume and we’ll recommend a probe spec that meets your replacement cycle targets.

How quickly can I get prototype probes for a new fixture build?

We respond to design requests within 1–3 days and deliver prototype probes within two weeks. When you’re ready for production volume, we scale on the same manufacturing line without switching vendors.

Quelles certifications Promax détient-elle pour la fabrication de sondes de test ?

Promax Pogo Pin is certified under ISO 9001, ISO 14001, ISO 45001, and IECQ QC080000. Our production facility maintains >99% mass production yield across 8,000+ custom designs delivered to clients including Huawei, Xiaomi, and Amphenol.

What’s the difference between working stroke and full stroke?

Working stroke is the recommended compression range for reliable contact during testing. Full stroke is the maximum physical travel the plunger can achieve. Always design your fixture within the working stroke range to maintain consistent spring force and contact resistance. Compressing beyond the working stroke shortens probe lifecycle and can damage the internal spring.

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