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Single-End Probe, Ø1.00 mm - PT068B60-1605E

Large-diameter probe for power rail testing and high-current test points. The wide contact footprint stays stable on bus bars and larger power pads.

Overall Length Plunger Diameter Contact Resistance Temp. Range Durability Rated Current Spring Force Working Stroke Full Stroke
16.05 mm Ø1.00 ±0.08 mm ≤40 mΩ −40°C to 80°C ≥20,000 cycles 2.4 A 60 gf ±20% 2.00 mm 2.44 mm
Specification Details
Overall Length16.05 mm
Plunger DiameterØ1.00 ±0.08 mm
Contact Resistance≤40 mΩ
Temperature Range−40°C to 80°C
Durability≥20,000 cycles
Rated Current2.4 A
Spring Force60 gf ±20%
Working Stroke2.00 mm
Full Stroke2.44 mm

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Single-End Probe, Ø0.60 mm - PT101B60-960A

Compact probe for mid-density board test and signal probing. The short body fits low-profile fixtures with limited Z-axis clearance.

Overall Length Plunger Diameter Contact Resistance Temp. Range Durability Rated Current Spring Force Working Stroke Full Stroke
9.60 ±0.15 mm Ø0.60 ±0.02 mm ≤50 mΩ −40°C to 85°C ≥60,000 cycles DC 12V, 1.0 A Max 60 gf ±15 gf 1.60 mm 2.00 mm
Specification Details
Overall Length9.60 ±0.15 mm
Plunger DiameterØ0.60 ±0.02 mm
Contact Resistance≤50 mΩ
Temp. Range−40°C to 85°C
Durability≥60,000 cycles
Rated CurrentDC 12V, 1.0 A Max
Spring Force60 gf ±15 gf
Working Stroke1.60 mm
Full Stroke2.00 mm

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Single-End Probe, Ø0.40 mm - PT062B80-2300A

Standard-diameter probe for general-purpose ICT and FCT bed-of-nails fixtures. It handles solder residue and light oxidation without flexing thinner boards.

Overall Length Plunger Diameter Contact Resistance Temp. Range Durability Rated Current Spring Force Working Stroke Full Stroke
23.00 mm Ø0.40 ±0.02 mm ≤75 mΩ −40°C to 80°C ≥100,000 cycles 1.5 A 80 gf ±20% 2.00 mm 3.50 mm
Specification Details
Overall Length23.00 mm
Plunger DiameterØ0.40 ±0.02 mm
Contact Resistance≤75 mΩ
Temp. Range−40°C to 80°C
Durability≥100,000 cycles
Rated Current1.5 A
Spring Force80 gf ±20%
Working Stroke2.00 mm
Full Stroke3.50 mm

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Single-End Probe, Ø0.20 mm - PB033B2600B-60A

Extended-length micro-diameter probe for test points that sit deep or recessed. The longer body reaches through thicker fixture plates and multi-layer board stacks.

Overall Length Plunger Diameter Contact Resistance Temp. Range Rated Current Spring Force Working Stroke Full Stroke
26.00 ±0.15 mm Ø0.20 ±0.01 mm ≤150 mΩ −40°C to 80°C 2.0 A 60 gf ±20% 3.50 mm 4.50 mm
Specification Details
Overall Length23.00 mm
Plunger DiameterØ0.40 ±0.02 mm
Contact Resistance≤75 mΩ
Temp. Range−40°C to 80°C
Durability≥100,000 cycles
Rated Current1.5 A
Spring Force80 gf ±20%
Working Stroke2.00 mm
Full Stroke3.50 mm

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Single-End Probe, Ø0.15 mm - PB031B570B-35A

Micro-diameter probe for fine-pitch IC test sockets, BGA interposers, and wafer-level probe cards. Use it where test point spacing drops below 0.50 mm.

Overall Length Plunger Diameter Contact Resistance Temp. Range Durability Rated Curren Spring Force Working Stroke Full Stroke
26.00 ±0.15 mm Ø0.20 ±0.01 mm ≤150 mΩ −40°C to 80°C ≥100,000 cycles 2.0 A 60 gf ±20% 3.50 mm 4.50 mm
Specification Details
Overall Length26.00 ±0.15 mm
Plunger DiameterØ0.20 ±0.01 mm
Contact Resistance≤150 mΩ
Temp. Range−40°C to 80°C
Durability≥100,000 cycles
Rated Current2.0 A
Spring Force60 gf ±20%
Working Stroke3.50 mm
Full Stroke4.50 mm

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How to Choose the Right Single-End Probe

how to choose the right single end probe

  1. Match plunger diameter to your test point pitch. Start with the pad size and center-to-center spacing on your DUT. Fine-pitch layouts below 0.50 mm need the Ø0.15–0.20 mm micro-diameter probes. Standard 2.54 mm pitch ICT fixtures use Ø0.40–0.60 mm probes. For power rail test points with larger pads, the Ø1.00 mm plunger provides the most stable contact.
  2. Set your contact resistance ceiling. Every milliohm in the test path adds measurement error. The PT068B60-1605E holds below 40 mΩ for power-level measurements. The PT062B80-2300A stays below 75 mΩ for general ICT. Micro-diameter probes run higher at 100–150 mΩ. That range suits digital signal testing, but is worth noting for analog precision work.
  3. Match cycle life to your production volume. A fixture running 500 boards per day accumulates 100,000+ probe cycles in under a year. Choose 100,000-cycle probes for medium-to-high volume. Reserve the 20,000-cycle PT068B60-1605E for lower-volume power test stations where current capacity matters more than longevity.
  4. Check your operating temperature range. Standard models cover −40°C to 80°C or 85°C. The PB031B570B-35A extends to 150°C for high-temperature burn-in and automotive thermal cycling fixtures. Specify probes rated for the full range of your test chamber temperatures, not just ambient.
  5. Consider the overall length and stroke. The PT101B60-960A at 9.60 mm fits compact fixture builds with limited Z-axis clearance. The PB033B2600B-60A at 26.00 mm reaches recessed or deep-set test points. The working stroke determines how much travel the probe absorbs during fixture closure. Match it to your fixture’s mechanical tolerance stack.
  6. Not sure? Talk to our engineers. Send us your board layout and fixture drawing. Our team of 20+ dedicated engineers respond within 1–3 days with a probe recommendation and free sample timeline.

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Trusted by Test Engineers Across Industries

Consumer Electronics / PCB Assembly

We swapped our previous probes for the PT062B80-2300A across six ICT fixtures running 800+ boards per shift. False failure rates dropped by roughly 35% in the first month. The probes held stable contact resistance past 120,000 cycles before we saw any drift. We used to rebuild fixtures every 10 weeks. Now we’re pushing past 16 weeks on the same probe set.

Wang Lei, Senior Test Engineer,

Consumer Electronics EMS, Shenzhen

Industry: Automotive / EV Power Module Testing

Our EV power module validation fixtures need probes that carry 2+ amps and survive thermal cycling from −40°C to 80°C. The PT068B60-1605E handled both without contact resistance exceeding 40 mΩ across the full temperature sweep. We ran 15,000 cycles under those conditions, and the probes stayed within spec. That consistency made a real difference during PPAP qualification.

J. Richter, Test Fixture Design Engineer,

Tier 1 Automotive Supplier, Stuttgart

Industry: Semiconductor / IC Package Test

We needed a probe that could hit 0.40 mm pitch BGA pads without damaging the bond surface. The PB031B570B-35A at Ø0.15 mm gave us the positional accuracy we needed, and the 35 gf spring force was low enough to avoid pad cratering. After 80,000+ touchdowns, we measured less than 5 mΩ drift in contact resistance. That kind of repeatability matters when you’re qualifying a new IC package.

Dr. S. Nakamura, Probe Card Design Lead,

Semiconductor Test House, Osaka

Single-End Probes FAQs

What is the smallest plunger diameter available for single-end probes?

We manufacture single-end probes with plunger diameters as small as Ø0.15 mm at a ±0.01 mm tolerance. At this scale, the probe fits test point pitches down to 0.50 mm for fine-pitch BGA and QFN package testing. The PB031B570B-35A delivers 35 gf spring force at this diameter. That is enough for oxide penetration while helping protect the bond pad.

How long do single-end probes last in a production fixture?

Cycle life ranges from 20,000 to 200,000+ insertions depending on plunger diameter, plating thickness, and spring force. Match the rated durability to your fixture’s expected lifetime test count. A line running 500 boards per day needs probes rated at 100,000 cycles minimum.

What is the difference between single-end and double-end probes?

A single-end probe has one spring-loaded plunger tip, and a fixed receptacle or solder tail at the opposite end. A double-end probe has spring-loaded plungers on both ends. Single-end probes anchor into the fixture plate for bed-of-nails testing. Double-end probes suit board-to-board and floating contact applications where both contact surfaces need compliance.

Can I get single-end probes with custom tip geometry?

Yes, our engineers design custom tip profiles for non-standard pad shapes, recessed test points, or specific connector interfaces. Send your DUT contact drawing, and our team provides a design recommendation within 1–3 business days. Custom parameters include tip shape, plunger diameter, spring force, overall length, and plating material.

What is the lead time for custom single-end probes?

We deliver prototype samples within two weeks of design confirmation. Mass production orders ship within 3–4 weeks. Engineering review of your specification begins within 1–3 business days of submission.

Do single-end probes work for high-current testing?

The PT068B60-1605E single-end probe carries up to 2.4 A continuous current with contact resistance below 40 mΩ. For test points requiring higher currents, contact our engineering team to discuss multi-contact or custom high-current probe configurations.

What certifications does Promax hold for test probe manufacturing?

We are certified under ISO 9001, ISO 14001, ISO 45001, and IECQ QC080000. Our production facility maintains greater than 99% mass production yield across 8,000+ custom designs delivered to clients including Huawei, Xiaomi, and Amphenol.

Do you offer free samples for qualification testing?

Yes, we provide free samples so you can validate fit, contact resistance, and mechanical compatibility in your fixture before committing to production. Standard catalog configurations ship within two weeks. Custom samples may take additional time depending on design complexity.

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